On-Chip Power Integrity Simulation Using LSI-Core Macromodels Considering Voltage Fluctuations Caused by Inter-Function-Block Interference

Autor:	Hiroshi Tanaka, Tohlu Matsushima, Yusuke Yano, Osami Wada
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Condensed Matter Physics Atomic and Molecular Physics and Optics
Zdroj:	IEEE Transactions on Electromagnetic Compatibility. 65:334-342
ISSN:	1558-187X 0018-9375
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dccd23f481506b1dda8a34583729807a https://doi.org/10.1109/temc.2022.3224704 Zobrazit plný text záznamu