Ionized Impurity Scattering in Isotopically Engineered, Compensated Ge:Ga,As

Autor:	Kohei M. Itoh, Wladek Walukiewicz, Jun'ichiro Muto, V. I. Ozhogin, John Farmer, Eugene E. Haller, Jeffrey W. Beeman, Takahiro Kinoshita
Rok vydání:	1997
Předmět:	Ionized impurity scattering Materials science Mechanics of Materials Mechanical Engineering General Materials Science Condensed Matter Physics Molecular physics
Zdroj:	Materials Science Forum. :77-82
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.258-263.77
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dcb5239891e7b336af6aab2c0ab2fac3 https://doi.org/10.4028/www.scientific.net/msf.258-263.77 Zobrazit plný text záznamu