Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation
| Autor: | D.B. Holtkamp, J.S. Browning |
|---|---|
| Rok vydání: | 1988 |
| Předmět: |
Physics
Nuclear and High Energy Physics Neutron transport Proton Physics::Instrumentation and Detectors business.industry Nuclear Theory Monte Carlo method Linear energy transfer Nuclear physics Nuclear Energy and Engineering Proton transport Particle Microelectronics Neutron Electrical and Electronic Engineering Nuclear Experiment business |
| Zdroj: | IEEE Transactions on Nuclear Science. 35:1629-1633 |
| ISSN: | 0018-9499 |
| Popis: | Cumulative fractions for linear energy transfer spectra were measured for particles ejected from microelectronics packaging materials subjected to neutron and proton irradiations. The measurements for the neutron irradiations compare well with Monte Carlo theoretical calculations. The spectra can be used to access microelectronics vulnerabilities in strategic-nuclear-weapon, space-trapped, and neutral-beam directed-energy particle environments. > |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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