Electronic structure and self-assembling processes in platinum metalloporphyrins: photoemission and AFM studies

Autor:	Denis V. Vyalikh, A. I. Belogorokhov, S. A. Trophimov, V. D. Rumiantseva, Andrey M. Ionov, S. I. Bozhko, A. N. Chaika
Rok vydání:	2008
Předmět:	Atomic force microscopy Chemical structure Analytical chemistry chemistry.chemical_element General Chemistry Electronic structure Spectral line chemistry.chemical_compound X-ray photoelectron spectroscopy chemistry Tetraphenylporphyrin Physical chemistry General Materials Science Thin film Platinum
Zdroj:	Applied Physics A. 94:473-476
ISSN:	1432-0630 0947-8396
DOI:	10.1007/s00339-008-4909-0
Popis:	The main goal of this paper is to investigate the electronic structure of valence band and core levels as well as surface topography of pristine tetraphenylporphyrin and Pt-based compounds Pt-TPP(p-COOH3)4, Pt-TPP(m-OCH3)4, PtCl2-TPP(m-OCH3)4 thin films. The electronic structure of various Pt-based metalloporphyrins which were investigated in dependence on their chemical structure and spectra were measured by high-resolution X-ray photoelectron spectroscopy (XPS) of valence band and Pt4f, Pt4d, C1s, O1s, N1s core levels. Results of atomic force microscopy (AFM) studies of topography and self-assembling processes in thin films of porphyrines are presented and discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dc4098cdf4a3c03870975bd81ddc70ed https://doi.org/10.1007/s00339-008-4909-0 Zobrazit plný text záznamu Full text from SpringerLink