Secure Integrated Circuit with Physical Attack Detection based on Reconfigurable Top Metal Shield
| Autor: | Byeoncheol Lee, Ji-Hoon Kim, Hyoungho Ko, Dong Kyue Kim, Kwonsang Han, Byong-Deok Choi, Jaesung Kim, Hyungseup Kim, Yeongjin Mun |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Hardware security module
Number generator business.industry Computer science Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Chip Focused ion beam Electronic Optical and Magnetic Materials law.invention law Shield Embedded system Hardware_INTEGRATEDCIRCUITS Smart card Electrical and Electronic Engineering business Electronic circuit |
| Zdroj: | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 19:260-269 |
| ISSN: | 2233-4866 1598-1657 |
| DOI: | 10.5573/jsts.2019.19.3.260 |
| Popis: | Invasive physical attacks on integrated circuits (ICs), such as de-packaging, focused ion beam (FIB) chip editing, and micro-probing attempts, constitute security threats for chips with potentially valuable information, such as smart cards. Using a state-of-the-art circuit-editing technique, an attacker can remove an IC’s top metal layer, leaving its secure information exposed to micro-probing attacks. Security ICs can be seriously threatened by such attacks and thus require on-chip countermeasures. Conventional active shields, however, have difficulty coping with physical attacks based on FIB chip editing (i.e., bypassing the top metal shield). This study presents a novel countermeasure against physical attacks based on the use of a reconfigurable metal shield for both top metal removal and microprobing attack detection. This shield consists of two circuits: an FIB chip editing detection circuit consisting of a random number generator and a micro-probing attempt detection circuit consisting of two conditionally synchronized ring oscillators. Both circuits share a randomly reconfigured top metal shield, which represents a promising solution for security against state-of-the-art invasive attacks. |
| Databáze: | OpenAIRE |
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