| Popis: |
A new extended method of surface-consistent deconvolution (s.-c. deconvolution) is presented that combines the benefits of trace-by-trace deconvolution and the strictly surface-consistent technique. The procedure employs the usual two steps: analysis (derivation of the model spectra) and application (actual operator design and deconvolution). In the application step, the spectrum of each trace is compared to its model. If the match is better than a given tolerance, the strictly s.-c. deconvolution is used. Otherwise, a “bad” trace has been detected, and an extra operator will be applied on top of the strictly surfaceconsistent operator. Additionally, the trace is flagged for optional surgical muting, to automatically edit the bad traces. |
