Optical anisotropy and surface morphology of InGaAs lattice-mismatched with GaAs(001)

Autor: Toshiharu Morimura, Takashi Hanada, Takafumi Yao, Takahiro Mori, Meoung Whan Cho
Rok vydání: 2004
Předmět:
Zdroj: Current Applied Physics. 4:621-624
ISSN: 1567-1739
DOI: 10.1016/j.cap.2004.01.034
Popis: We investigated surface morphology and optical anisotropy of strained InGaAs films grown on GaAs(0 0 1) substrate using atomic force microscopy (AFM) and reflectance difference/reflectance anisotropy spectroscopy (RDS/RAS). High temperature (HT)-grown samples were found to have a rippled surface structure, however for films grown using a low temperature (LT) growth technique, the surface morphology was significantly improved, without the ripple structure seen on the HT samples. Furthermore, ex situ RD spectra of LT-grown samples showed notable peaks near the critical energies of band structure originated from bulk electronic transitions.
Databáze: OpenAIRE