Autor: |
Toshiharu Morimura, Takashi Hanada, Takafumi Yao, Takahiro Mori, Meoung Whan Cho |
Rok vydání: |
2004 |
Předmět: |
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Zdroj: |
Current Applied Physics. 4:621-624 |
ISSN: |
1567-1739 |
DOI: |
10.1016/j.cap.2004.01.034 |
Popis: |
We investigated surface morphology and optical anisotropy of strained InGaAs films grown on GaAs(0 0 1) substrate using atomic force microscopy (AFM) and reflectance difference/reflectance anisotropy spectroscopy (RDS/RAS). High temperature (HT)-grown samples were found to have a rippled surface structure, however for films grown using a low temperature (LT) growth technique, the surface morphology was significantly improved, without the ripple structure seen on the HT samples. Furthermore, ex situ RD spectra of LT-grown samples showed notable peaks near the critical energies of band structure originated from bulk electronic transitions. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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