Focused ion beam processing for transmission electron microscopy of composite/adhesive interfaces

Autor:	J. Tagami, Alireza Sadr, Turki A. Bakhsh
Rok vydání:	2014
Předmět:	Molar Ultramicrotomy Materials science Filtek Supreme Ultra Composite number Surfaces and Interfaces General Chemistry Focused ion beam Surfaces Coatings and Films Mechanics of Materials Transmission electron microscopy Materials Chemistry Adhesive Filtek silorane Composite material
Zdroj:	Journal of Adhesion Science and Technology. 29:232-243
ISSN:	1568-5616 0169-4243
DOI:	10.1080/01694243.2014.981481
Popis:	Although most transmission electron microscope (TEM) investigations were carried out using conventional ultramicrotomy, they were limited to the tooth/adhesive resin interface and were difficult to accomplish for the resin-composite interface. Some of these limitations have been overcome with the introduction of focused ion beam (FIB) milling. Therefore, the objective of the study was to compare different composites/adhesive interfaces using FIB/TEM technique. Cylindrical cavities were prepared in extracted human molar teeth. The restored cavities were divided into four groups: (1) One-step self-etch Scotchbond Universal (SBU; 3M ESPE, USA), (2) all-in-one Xeno-V+ adhesive (X5P; DENTSPLY, Germany), (3) two-step etch-and-rinse Prime and Bond NT (PNT; DENTSPLY, Germany) that were restored with Filtek Supreme Ultra Universal composite (3M ESPE, USA), and (4) teeth restored with the two-step self-etch Filtek Silorane adhesive (SSA; 3M ESPE, USA) that were restored with its corresponding Filtek Silorane compos...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::db8b87e5058eb6b858038f61bc0d8af8 https://doi.org/10.1080/01694243.2014.981481 Zobrazit plný text záznamu