Automated XPS Analysis of Passivated Stainless Steel to the SEMI Standard

Autor:	RG White, Richard J. Lee, BR Strohmeier, JD Piasecki, Tim Nunney
Rok vydání:	2010
Předmět:	Materials science X-ray photoelectron spectroscopy Metallurgy Instrumentation
Zdroj:	Microscopy and Microanalysis. 16:436-437
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927610057569
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::db8a0cc7e3d0a8f35facb95e0cc761ad https://doi.org/10.1017/s1431927610057569 Zobrazit plný text záznamu