Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams

Autor:	David D. Cohen, Zeljko Pastuovic, Rainer Siegele
Rok vydání:	2019
Předmět:	Nuclear and High Energy Physics Range (particle radiation) Materials science Ion beam analysis Proton Analytical chemistry chemistry.chemical_element Ion Secondary ion mass spectrometry chemistry Ionization Lithium Nuclear Experiment Spectroscopy Instrumentation
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 450:19-23
ISSN:	0168-583X
DOI:	10.1016/j.nimb.2018.09.017
Popis:	Heavy ion Particle Induced X-ray Emission (PIXE) spectroscopy offers a number of advantages over standard proton PIXE, such as higher yields and therefore higher sensitivity. However, in order to be able to use heavy ion PIXE more detailed measurements of the ionisation and X-ray cross sections for heavy ions are required. This issue was recognised by one of the Coordinated Research Projects (CRP) of the IAEA on MeV Secondary Ion Mass Spectrometry (SIMS). ANSTO took part in this CRP and we measured X-ray production cross sections on a range of samples for oxygen and lithium beam in the energy range of 4.8–30 MeV and 3–12 MeV, respectively. Here we report on these X-ray production cross section measurements and compare the results with theoretical models. Further energy shifts of the characteristic X-ray lines for the different ion-target combinations are presented and discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::db3b04c00e2d110d193be731206d667e https://doi.org/10.1016/j.nimb.2018.09.017 Zobrazit plný text záznamu Full Text from ScienceDirect