Reliability of Nondeteriorating Devices

Autor:	L. Caldarola
Rok vydání:	1974
Předmět:	Reliability theory Sequence Engineering Stochastic process business.industry General theory Control theory Electronic engineering Electrical and Electronic Engineering Safety Risk Reliability and Quality business Reliability (statistics) Voltage Electronic circuit Degradation (telecommunications)
Zdroj:	IEEE Transactions on Reliability. :219-222
ISSN:	1558-1721 0018-9529
Popis:	A general theory has been developed for calculating the reliability of a device which does not deteriorate with time and which is exposed to a stochastic load. Two important cases of stochastic loads have been considered: (1) statistically independent random pulses, and (2) a sequence of random pulses, each one separated from the next one by a random period of time during which no load is applied to the device. Numerical examples are included.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::dabc4eb0ef7d0006a801a344b7c7cfba https://doi.org/10.1109/tr.1974.5215248 Zobrazit plný text záznamu