| Autor: |
Shuai Liu, Wen Zhen Qin, Xian Hua Tian, Jun Zhao |
| Rok vydání: |
2016 |
| Předmět: |
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| Zdroj: |
Key Engineering Materials. 693:689-696 |
| ISSN: |
1662-9795 |
| DOI: |
10.4028/www.scientific.net/kem.693.689 |
| Popis: |
Optical profiler is employed to measure the surface topography of H-13 die steel machined by ball end cutter. By using 2D discret wavelet decomposition, the topographies of different frequency bands are obtained and the influence of cutter posture on varying frequncy bands topography is studied. The results show that cutter posture has a great influence on the whole frequency band roughness. The changing trend of roughness is roughly the same under different cutter postures which increase firstly then decrease with the decrease in frequency. A surface with a small high frequency roughness may have a large median frequency roughness. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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