Planar x-ray waveguide as a possible alternative to x-ray polycapillary optics

Autor:	Vladimir K. Egorov, Evgeniy V. Egorov
Rok vydání:	2002
Předmět:	Total internal reflection Materials science Spectrometer business.industry Astrophysics::High Energy Astrophysical Phenomena X-ray optics law.invention Planar Reflection (mathematics) Optics law business Waveguide Beam (structure) Diffractometer
Zdroj:	International Conference on X-ray and Neutron Capillary Optics.
ISSN:	0277-786X
DOI:	10.1117/12.489767
Popis:	Features of a planar x-ray waveguide (PXW) functioned on the base of an x-ray total reflection phenomenon and been distinguished by an air clearance presense as the transportation medium are discussed. It is shown that the narrow size clearance area exists, and it is characterized by a resonance manner of an x-ray beam guiding across the waveguide. The high efficiency of the x-ray beam transporation systems based on planar x-ray waveguides allows them to complete with guiding abilities of the polycapillary optics. Characteristics of an x-ray diffractometer and TXRF-spectrometer equipped with PXW are analyzed. The experimental data of a thin film testing at application of the diffractometer and the TXRF spectrometer built with using PXW are presented. The design of the planar x-ray waveguide-monochromator is considered, in passing.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::da417d47c188dd9c706206a7b9e6b758 https://doi.org/10.1117/12.489767 Zobrazit plný text záznamu