Anti-phase domain boundaries in ZnGeP2 (ZGP)
| Autor: | R. Fledman, I. Dahan, Y. Shimony, G. Kimmel |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Diffraction
Materials science Condensed matter physics Anti-phase domain Organic Chemistry Dark field microscopy Crystallographic defect Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Inorganic Chemistry Crystallography Tetragonal crystal system Electron diffraction Transmission electron microscopy Lattice (order) Electrical and Electronic Engineering Physical and Theoretical Chemistry Spectroscopy |
| Zdroj: | Optical Materials. 16:119-123 |
| ISSN: | 0925-3467 |
| Popis: | Coherently oriented cubic defects were recently reported to exist within the tetragonal lattice of zinc–germanium–phosphide, ZnGeP2 (ZGP). X-ray diffraction utilizing whole pattern optimization (Rietveld method) and line-profile-fitting (LPF) enabled us to identify these defects. In the present research, transmission electron microscopy (TEM) was used for direct observation of these defects. The bright field and dark field TEM images of the ZGP foil indicate the existence of anti-phase domain boundaries (APB). Electron diffraction patterns clearly reveal two coherently oriented entities, one of a tetragonal symmetry in accordance with the chalcopyrite lattice, the other however of a cubic symmetry. This confirms our former finding of the existence of coherently oriented cubic defects in as-grown chalcopyrite ZGP crystal. |
| Databáze: | OpenAIRE |
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