Machine Learning Assisted Nanoscale Device Modeling for Nanosheet FETs with Process Variations
| Autor: | Yaoyang Lyu, Wangyong Chen, Mingyue Zheng, Binyu Yin, Jinning Li, Linlin Cai |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE Silicon Nanoelectronics Workshop (SNW). |
| Databáze: | OpenAIRE |
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