Confocal Raman Microspectroscopy Using a Stigmatic Spectrograph and CCD Detector

Autor:	B. J. Kip, D. N. Batchelder, K. P. J. Williams, G. D. Pitt
Rok vydání:	1994
Předmět:	Microscope Materials science business.industry Confocal law.invention Optical axis symbols.namesake Optics law Confocal microscopy symbols Pinhole (optics) Raman microscope business Raman spectroscopy Instrumentation Spectrograph Spectroscopy
Zdroj:	Applied Spectroscopy. 48:232-235
ISSN:	1943-3530 0003-7028
Popis:	Confocal Raman microspectroscopy has previously used pinholes placed at the back focal plane of the microscope to provide depth resolution along the optical axis. The process of optimizing the pinhole alignment can often be difficult and time-consuming. We demonstrate a different approach to setting up a confocal Raman microscope using a stigmatic spectrograph and a CCD detector. This arrangement is easy to use and provides a depth resolution of ∼2 μm.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::da13374de32b6e93b70e483ccbec312b https://doi.org/10.1366/0003702944028407 Zobrazit plný text záznamu