Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Autor:	Frank Kahl, Marcel Niestadt, Stephan Uhlemann, Heiko Müller, Ute Kaiser, Peter Hartel, Max Haider, Martin Linck, Johannes Biskupek, J. Zach
Rok vydání:	2016
Předmět:	Microscope Materials science business.industry 02 engineering and technology 021001 nanoscience & nanotechnology Salve 01 natural sciences law.invention Optics Atomic resolution law 0103 physical sciences 010306 general physics 0210 nano-technology business Instrumentation
Zdroj:	Microscopy and Microanalysis. 22:878-879
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927616005237
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d9fb4fd3fc755c21a2556e16e618b8c2 https://doi.org/10.1017/s1431927616005237 Zobrazit plný text záznamu