Potential Induced Degradation (PID) Power Loss Correlation to Leakage and Reverse Bias Currents

Autor: Michalis Florides, George Makrides, Georgics Konstantinou, Venizelos Venizelau, George E. Georghiou
Rok vydání: 2017
Předmět:
Zdroj: 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
Popis: This paper presents the results of power loss of multi-crystalline solar cells due to Potential Induced Degradation (PID) and its relation to the leakage and reverse bias currents of the cells under test. An outdoor test infrastructure was constructed at the PV Lab, University of Cyprus and a bias voltage of 1000 V DC was applied between the cell's wire terminals and its frame. The resulting leakage current was measured and its dependence on ambient temperature, relative humidity and solar irradiance was derived. In addition, the power loss of the cell was related to leakage and reverse bias currents as the degradation was progressing in order to establish whether these parameters could be used for early PID detection. This was achieved by Flash tests and correlation of the power reduction to the measured leakage and reverse bias currents.
Databáze: OpenAIRE