Leveraging Single Atom Dynamics to Measure the Electron-Beam-Induced Force and Atomic Potentials

Autor:	Maxim Ziatdinov, Feng Bao, Ali Yousefzadi Nobakht, Rick Archibald, Stephen Jesse, Sergei V. Kalinin, Seungha Shin, Artem Maksov, Ondrej Dyck, Kody J. H. Law, Bobby G. Sumpter
Rok vydání:	2018
Předmět:	Materials science Atom (measure theory) Dynamics (mechanics) Measure (physics) Cathode ray 02 engineering and technology Atomic physics 010402 general chemistry 021001 nanoscience & nanotechnology 0210 nano-technology 01 natural sciences Instrumentation 0104 chemical sciences
Zdroj:	Microscopy and Microanalysis. 24:96-97
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927618000971
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d8db14b1a8c61fc254eb9a16debf3c58 https://doi.org/10.1017/s1431927618000971 Zobrazit plný text záznamu