Understanding and Overcoming Water-induced Interfacial Degradation in Si Modules (Final Technical Report)

Autor:	Maria K. Y. Chan, David P. Fenning, Mariana I. Bertoni, Rishi E. Kumar, April M. Jeffries, Guillaume von Gastrow, Arun Mannodi Kanakkithodi, Nicholas Theut
Rok vydání:	2021
Předmět:	Materials science business.industry Degradation (geology) Process engineering business
DOI:	10.2172/1773388
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d8aa36f2bf9cb608cb1468eea46c926c https://doi.org/10.2172/1773388 Zobrazit plný text záznamu