Automated Image Analysis for Electron Microscopy Specimen Assessment
| Autor: | Coudray, Nicolas, Buessler, Jean-Luc, Kihl, Hubert, Urban, Jean-Philippe |
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| Rok vydání: | 2007 |
| DOI: | 10.5281/zenodo.40228 |
| Popis: | Publication in the conference proceedings of EUSIPCO, Poznan, Poland, 2007 |
| Databáze: | OpenAIRE |
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