Time-resolved two photon photoemission electron microscopy
| Autor: | O. Andreyev, Michael Bauer, Gerd Schönhense, M. Scharte, Martin Aeschlimann, R. Porath, C. Wiemann, Oliver G. Schmidt |
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| Rok vydání: | 2002 |
| Předmět: |
Microscope
Materials science Physics and Astronomy (miscellaneous) business.industry Inverse photoemission spectroscopy General Engineering Physics::Optics General Physics and Astronomy Angle-resolved photoemission spectroscopy Electron law.invention Condensed Matter::Materials Science Photoemission electron microscopy Semiconductor law Femtosecond Condensed Matter::Strongly Correlated Electrons Atomic physics Electron microscope business |
| Zdroj: | Applied Physics B. 74:223-227 |
| ISSN: | 1432-0649 0946-2171 |
| Popis: | Femtosecond, time-resolved two photon photoemission has been used to map the dynamics of photo-excited electrons at a structured metal/semiconductor surface. A photoemission microscope was employed as a spatially resolving electron detector. This novel setup has the potential to visualize variations of hot electron lifetimes in the femtosecond regime on heterogeneous sample surfaces and nanostructures. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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