Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)
| Autor: | M. Poretskiy, K.-H. Gericke, Christof Maul, A. I. Chichinin |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Scattering
Analytical chemistry 02 engineering and technology 021001 nanoscience & nanotechnology Kinetic energy Mass spectrometry 01 natural sciences Secondary electrons Electronic Optical and Magnetic Materials Ion Metal visual_art 0103 physical sciences visual_art.visual_art_medium 010306 general physics 0210 nano-technology |
| Zdroj: | Bulletin of the Lebedev Physics Institute. 45:303-307 |
| ISSN: | 1934-838X 1068-3356 |
| Popis: | A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl−, H−) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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