Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies
| Autor: | Semiu A. Olowogemo, Hao Qiu, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). |
| DOI: | 10.1109/dft56152.2022.9962348 |
| Databáze: | OpenAIRE |
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