Determining the parameters of single-layer structures by analyzing the envelopes of the Fabry-Perot spectra
| Autor: | P. S. Kosobutskii |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Surface (mathematics)
Materials science business.industry Applied Mathematics General Engineering Substrate (electronics) Interference (wave propagation) Atomic and Molecular Physics and Optics Spectral line Computational Mathematics Optics Reflection (physics) business Spectroscopy Refractive index Fabry–Pérot interferometer |
| Zdroj: | Journal of Optical Technology. 73:61 |
| ISSN: | 1070-9762 |
| DOI: | 10.1364/jot.73.000061 |
| Popis: | Starting from an analysis of the laws governing the formation of envelopes as the values of the energy coefficients at the extrema (R,T)max,min of the interference fringes of light on a single-layer structure when a wave is transmitted normally through the interfaces, a basis is provided for applications of practical importance of Fabry-Perot spectroscopy in the reflection and transmission geometry for determining the parameters of transparent and absorbing films that are free or attached to the surface of a semifinite substrate. |
| Databáze: | OpenAIRE |
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