Testing and trimming methods of high-resolution and large swing for ADC based on ATE

Autor: Liran Li, Pengcheng Xiao, Zhenhai Lu, YuBo Wang, Yi Hu, Yuan Guan, Kun Wang, Dameng Li, Fan Zhang
Rok vydání: 2021
Zdroj: 2021 IEEE 14th International Conference on ASIC (ASICON).
DOI: 10.1109/asicon52560.2021.9620461
Databáze: OpenAIRE