Rapid diagnostics of advanced standard cell using laser voltage probing and dynamic laser stimulation

Autor: Jui-Hao Chao, Guang-Qi Lin, Ming-Sheng Sun, Li-Qing Chen, Zhe Zhao, Ke Su
Rok vydání: 2017
Předmět:
Zdroj: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
DOI: 10.1109/ipfa.2017.8060164
Popis: Based on Meridian system, failure analysis of an advanced process LCD driver IC were conducted using laser voltage probing (LVP) and dynamic laser stimulation (DLS) techniques. The results demonstrate that LVP technique can effectively track cell transmission signal and intensity, and that failed location can be further identified accurately by using DLS technique followed by layout circuit analysis.
Databáze: OpenAIRE