Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation

Autor:	Ali Jouni, Mathieu Sicre, Victor Malherbe, Bastien Mamdy, Thomas Thery, Jean-Marc Belloir, Dimitri Soussan, Serge De Paoli, Vincent Lorquet, Valérian Lalucaa, Cédric Virmontois, Gilles Gasiot, Vincent Goiffon
Rok vydání:	2023
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 70:515-522
ISSN:	1558-1578 0018-9499
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d8228cd5402b1370fd8d311523a669d7 https://doi.org/10.1109/tns.2023.3248521 Zobrazit plný text záznamu