{1-x SrBi2Ta2O9-x Bi3TiTaO9} Materials: structural behavior and ferroelectric response
| Autor: | Sergey K. Filippov, Ram S. Katiyar, P. S. Dobal, K. A. Kuenhold, R. E. Melgarejo, Maharaj S. Tomar |
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| Rok vydání: | 2001 |
| Předmět: |
Diffraction
Materials science Mechanical Engineering Analytical chemistry Mineralogy Material system Condensed Matter Physics Ferroelectricity Dielectric spectroscopy symbols.namesake Mechanics of Materials symbols Chemical solution General Materials Science Dielectric function Thin film Raman spectroscopy |
| Zdroj: | Materials Science and Engineering: B. 83:89-96 |
| ISSN: | 0921-5107 |
| Popis: | Ferroelectric memory was observed in {1- x SrBi 2 Ta 2 O 9 - x Bi 3 TiTaO 9 } material for the composition x =0.3. Thus, there is interest in the investigation of detailed properties of this material system. We report on the structural and electrical properties of this material system using X-ray diffraction, Raman spectroscopy, impedance spectroscopy, and ferroelectric measurements. These studies suggest that high quality powder and thin films could be prepared for all compositions by a chemical solution route at the temperature ranging from 650 to 750°C. Ferroelectric response was also observed in thin film (for x =0.5) and pellet (for x =0.0) samples. |
| Databáze: | OpenAIRE |
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