Quantitative surface topography of martensitic microstructure by differential interference contrast microscopy
| Autor: | Zhuohui Zeng, Xian Chen, Chenbo Zhang, Shengwang Du |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Surface (mathematics)
Materials science Atomic force microscopy Mechanical Engineering 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Microstructure 01 natural sciences 010305 fluids & plasmas Martensitic microstructure Differential interference contrast microscopy Mechanics of Materials Martensite 0103 physical sciences Microscopy Composite material Deformation (engineering) 0210 nano-technology |
| Zdroj: | Journal of the Mechanics and Physics of Solids. 124:102-114 |
| ISSN: | 0022-5096 |
| DOI: | 10.1016/j.jmps.2018.10.007 |
| Popis: | We theorize a mathematical model by which the topography and the full-field deformation of martensitic microstructure are quantitatively determined by the reflected light differential interference contrast microscopy technique. Using the commercial reflected light DIC microscope (Nikon Ni-U), we determine the optical parameters for the proposed mathematical model using calibrated standard samples. Based on the theory, we conduct an experiment to demonstrate the determination of the surface relief of the microstructure comprised of a pair of twinned martensitic variants. The surface height gradients of the two martensite variants along the beam-shear direction of DIC agree well with the values measured by the atomic force microscopy. The measured results of twin laminates reveal that the current microscopy system can resolve the microstructure with the fineness of around 500 nm. Compared with the AFM results, it measures the surface slope with 0.005 rad accuracy. This paper underlies a new approach for quantitative surface topography determination with wide applications in experimental mechanics. |
| Databáze: | OpenAIRE |
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