Enhanced Power and Electromagnetic SCA Resistance of Encryption Engines via a Security-Aware Integrated All-Digital LDO
| Autor: | Monodeep Kar, Anand Rajan, Sanu Mathew, Venkata Chaitanya Krishna Chekuri, Vivek De, Arvind Singh, Saibal Mukhopadhyay |
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| Rok vydání: | 2020 |
| Předmět: |
Physics
business.industry 020208 electrical & electronic engineering Advanced Encryption Standard Electrical engineering 02 engineering and technology Encryption CMOS Test vector Datapath 0202 electrical engineering electronic engineering information engineering Correlation power analysis Electrical and Electronic Engineering business Voltage reference Leakage (electronics) |
| Zdroj: | IEEE Journal of Solid-State Circuits. 55:478-493 |
| ISSN: | 1558-173X 0018-9200 |
| Popis: | This article demonstrates enhanced power (P) and electromagnetic (EM) side-channel analysis (SCA) attack resistance of standard (unprotected) 128-bit advanced encryption standard (AES) engines with parallel (P-AES, 128-bit) and serial (S-AES, 8-bit) datapaths and a 128-bit SIMON engine with the bit-serial (1-bit) datapath by an on-die security-aware all-digital low-dropout (DLDO) regulator. The proposed DLDO improves SCA resistance using control-loop-induced perturbations in a nominal DLDO, enhanced by a random switching noise injector (SNI) by power-stage control and a randomized reference voltage (R-VREF) generator coupled with all-digital clock modulation (ADCM). SCA performed on the measured power/EM signatures acquired from a 130-nm CMOS testchip demonstrates up to 25 $\times $ reduction in test vector leakage assessment (TVLA) leakage for P-AES and 3579 $\times $ , 2182 $\times $ , and 500 $\times $ increase in minimum-traces-to-disclose (MTD) 80% of the subkeys for P-AES, S-AES, and SIMON cores, respectively, with respect to correlation power analysis (CPA) and correlation EM analysis (CEMA). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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