Raman spectroscopy of CuInSe2 thin films prepared by selenization
| Autor: | V. Riede, Klaus Bente, E. P. Zaretskaya, O.V. Ermakov, W. Schmitz, V.F. Gremenok, V.B. Zalesski |
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| Rok vydání: | 2003 |
| Předmět: |
Chalcopyrite
Scanning electron microscope Chemistry Analytical chemistry Recrystallization (metallurgy) General Chemistry Condensed Matter Physics symbols.namesake Full width at half maximum visual_art Molecular vibration visual_art.visual_art_medium symbols General Materials Science Thin film Raman spectroscopy Raman scattering |
| Zdroj: | Journal of Physics and Chemistry of Solids. 64:1989-1993 |
| ISSN: | 0022-3697 |
| Popis: | CuInSe 2 (CIS) thin films were prepared by two-step selenization at various recrystallization temperatures. The comparative analysis of crystalline properties evaluated by XRD, SEM, EDX and Raman scattering measurements is presented here. The crystallized films show Raman spectra with a dominant A 1 mode at 174 cm −1 , generally observed in I–II–VI 2 chalcopyrite compounds and an additional peak at 258 cm −1 . Relative intensity and FWHM of A 1 mode correlates with the enhancement of the structural properties of the films. The origin of 258 cm −1 mode is discussed in terms of the presence of other phase with the symmetry of lattice vibrations different than that of CuInSe 2. |
| Databáze: | OpenAIRE |
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