Reliability of Active-Matrix Organic Light-Emitting-Diode Arrays With Amorphous Silicon Thin-Film Transistor Backplanes on Clear Plastic

Autor: James C. Sturm, Sigurd Wagner, Ke Long, Kunigunde H. Cherenack, Jian-Zhang Chen, K. Rajan, B. Hekmatshoar, Mike Hack, A.Z. Kattamis
Rok vydání: 2008
Předmět:
Zdroj: IEEE Electron Device Letters. 29:63-66
ISSN: 1558-0563
0741-3106
DOI: 10.1109/led.2007.910800
Popis: We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 degC using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of the light emission over time.
Databáze: OpenAIRE