Autor: |
B. Hitti, C. D. Lamp, Kim H. Chow, T. L. Estle, R. L. Lichti, J. W. Schneider, S. R. Kreitzman, Philippe Mendels |
Rok vydání: |
1994 |
Předmět: |
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Zdroj: |
Hyperfine Interactions. 86:673-679 |
ISSN: |
1572-9540 |
DOI: |
10.1007/bf02068962 |
Popis: |
The radio frequencyμSR technique developed at TRIUMF was used to measure the temperature dependence of the diamagnetic muon, Mu, and Mu* amplitudes in silicon between 10 K and 500 K. Six samples doped with phosphorus (n-type) and boron (p-type) in the concentration range 1011 to 1015 cm−3 were studied. In pure Si a very good fit over the whole temperature range is obtained from a model that includes the ionization of Mu* and Mu to a bond centeredμ+ followed at high temperature by charge exchange involving Mu. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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