The surface characterization of model charged and sterically stabilized polymer colloids by SSIMS and X.p.s
| Autor: | J. Hearn, S.S. Davis, A. Brindley, R. A. P. Lynn, M. C. Davies, John F. Watts |
|---|---|
| Rok vydání: | 1992 |
| Předmět: |
chemistry.chemical_classification
Steric effects Static secondary-ion mass spectrometry Polymers and Plastics Organic Chemistry Analytical chemistry Polymer Charged particle Secondary ion mass spectrometry Colloid chemistry X-ray photoelectron spectroscopy Chemical engineering Materials Chemistry Particle |
| Zdroj: | Polymer. 33:1112-1115 |
| ISSN: | 0032-3861 |
| Popis: | X-ray photoelectron spectroscopy (X.p.s.) and static secondary ion mass spectrometry (SSIMS) have been applied to the surface chemical analysis of charged and sterically stabilized polymer colloids. The techniques provide complementary evidence for the surface orientation of both the charged polymer end groups and polymer chains responsible for the steric barrier. The findings are discussed in terms of the particle formation mechanisms and the biological interactions of such colloid systems. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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