Defect Detection in Photovoltaic Modules Using Electroluminescence Imaging
| Autor: | Mansouri, A., Zettl, M., Mayer, O., Lynass, M., Bucher, M., Stern, O., Burhenne, R. |
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| Jazyk: | angličtina |
| Rok vydání: | 2012 |
| Předmět: | |
| DOI: | 10.4229/27theupvsec2012-4bv.2.45 |
| Popis: | 27th European Photovoltaic Solar Energy Conference and Exhibition; 3374-3378 Electroluminescence (EL) imaging for photovoltaic applications has been widely discussed in the last years. In this contribution, the results of an all-around evaluation of this technique in regard to defect detection and quality assessment in photovoltaic modules are presented. The optimal system parameters including the camera position, its focal length and aperture size, the exposure time and the applied voltage and current, are debated and defined. The aptitude of the EL system for detecting failures and deficiencies in both crystalline and thin film PV modules (CdTe and CIGS) is thoroughly analyzed and an exhaustive defect catalogue is established. In crystalline silicon devices, cell breakages resulting from micro-cracks were proven to represent the major problem and remarkably affect the module performance. A linear correlation between the size of the breakages and the power drop in the module could be established. Further, mechanical stress and temperature change could be identified as the major cause behind the proliferation of cracks and breakages. In thin film modules, EL imaging proved a remarkable reduction in the size of localized shunts under the effect of light soaking (together with a performance improvement of up to 8%). Aside from that, the system was applied for monitoring TCO corrosion effects, laser scribing induced failures, as well as several problems related to the module junction box in regard to its sealing and the quality of its electric connectors. |
| Databáze: | OpenAIRE |
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