Impedance spectroscopy for high resolution measurements of energetic distributions of localized states in organic semiconductors
| Autor: | Hiroyoshi Naito, Shingo Ishihara, Hiroyuki Hase, Takashi Nagase, Takayuki Okachi, Takashi Kobayashi |
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| Rok vydání: | 2014 |
| Předmět: |
Materials science
Organic solar cell business.industry Resolution (electron density) Metals and Alloys Surfaces and Interfaces Molecular physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Dielectric spectroscopy Organic semiconductor Polyfluorene chemistry.chemical_compound chemistry Materials Chemistry Optoelectronics Thin film business Derivative (chemistry) Diode |
| Zdroj: | Thin Solid Films. 554:218-221 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2013.05.159 |
| Popis: | A method has been proposed for the determination of energetic distributions of localized states in organic semiconductors by the analysis of the impedance spectra (T. Okachi, T. Nagase, T. Kobayashi, and H. Naito, Appl. Phys. Lett. 94 (2009) 043301). High energetic resolution of the method is demonstrated experimentally in organic semiconductor diodes using a polyfluorene derivative, poly(9,9-dioctyl-fluorene-co-N-(4-butylphenyl)-diphenylamine), by detecting a structured localized-state distribution. The method is a powerful tool for the determination of energetic distributions of localized states with high energetic resolution in organic thin film devices such as organic light-emitting diodes and organic solar cells. |
| Databáze: | OpenAIRE |
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