Yield Optimization in Electronic Circuits Design
Autor: | Angelo Ciccazzo, Vittorio Latorre, Gianni Di Pillo |
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Rok vydání: | 2016 |
Předmět: | |
Zdroj: | Mathematics in Industry ISBN: 9783319234120 |
DOI: | 10.1007/978-3-319-23413-7_60 |
Popis: | In this work we propose an approach that combines a Support Vector learning Machine with a Derivative-Free black box optimization algorithm in order to maximize the yield in the production of electronic circuits. This approach is tested on a circuit provided by ST-Microelectronics, to be employed in consumer electronics. The results of the approach are compared with the results of WiCkeD, a commercial software largely used for integrated circuits analysis. |
Databáze: | OpenAIRE |
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