Noise characterization uncertainty of microwave devices under low current operation

Autor:	R. Lucero, C. Moyer, R. Vaitkus, Michael Dydyk
Rok vydání:	2003
Předmět:	Materials science business.industry Tuner Noise (electronics) Noise characterization Gallium arsenide chemistry.chemical_compound chemistry Electronic engineering Optoelectronics Reflection coefficient Current (fluid) business Microwave
Zdroj:	IEEE MTT-S International Microwave Symposium Digest.
DOI:	10.1109/mwsym.1989.38866
Popis:	An automated source reflection coefficient synthesizer combined with a mechanical output tuner was used in conjunction with gage capability studies for the characterization of the noise parameters of GaAs MESFETs and planar-doped pseudomorphic MODFETS operating at low currents (I/sub ds/ >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d74d096e072622b42d5652ecf732fed5 https://doi.org/10.1109/mwsym.1989.38866 Zobrazit plný text záznamu