Electrical Transport Properties of 3D Vertically Stacked p-MOS SiGe and SiGeC Nanowires

Autor: Amer El Hajj Diab, Emeline Saracco, Irina Ionica, Caroline Bonafos, Jean-François Damlencourt, Sorin Cristoloveanu
Rok vydání: 2011
Zdroj: ECS Meeting Abstracts. :1436-1436
ISSN: 2151-2043
DOI: 10.1149/ma2011-01/23/1436
Popis: not Available.
Databáze: OpenAIRE