Influence of changes in the waveguide thickness on the efficiency of Bragg diffraction of radiation by grating structures

Autor: V L Smirnov, Yu A Bykovskiĭ, V N Sorokovikov
Rok vydání: 1980
Předmět:
Zdroj: Soviet Journal of Quantum Electronics. 10:1376-1378
ISSN: 0049-1748
DOI: 10.1070/qe1980v010n11abeh010315
Popis: A study is made of the influence of the waveguide thickness on the Bragg diffraction efficiency and the possibility of utilizing this effect to develop highly sensitive detectors for small displacements and strain gauges is examined. It is shown that if the waveguide thickness deviates by 1.8 nm from its initial value of 1.1 μ, this causes 10% modulation of the radiation.
Databáze: OpenAIRE