Investigations on Hot-wall deposited Cadmium Sulphide buffer layer for thin film solar cell
| Autor: | S. Prasanna, N. Prabavathy, N. Muthukumarasamy, K. Sivakumaran, M.D. Kannan, Vijayshankar Asokan, G. Balaji, R. Balasundaraprabhu, M.R. Venkatraman |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Band gap Mechanical Engineering Analytical chemistry 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences symbols.namesake Vacuum deposition X-ray photoelectron spectroscopy Mechanics of Materials Transmission electron microscopy 0103 physical sciences symbols General Materials Science Thin film Selected area diffraction 0210 nano-technology Raman spectroscopy Layer (electronics) |
| Zdroj: | Materials Letters. 222:82-87 |
| ISSN: | 0167-577X |
| Popis: | Cadmium Sulphide (CdS) thin films were deposited on to well-cleaned soda lime glass substrates using hot wall deposition technique at room temperature. The structure of CdS thin films was found to be hexagonal with orientation and after annealing the film crystallized to , , , directions. Raman Spectroscopy confirmed the hexagonal structure with a shift at 312 cm(1). SAED pattern from the Transmission electron microscopy also confirmed the formation of hexagonal CdS. X-ray Photoelectron Spectroscopy confirmed the formation of CdS with relevant at% of Cd and S. Field emission scanning electron microscopy images revealed smooth surface of the thin film with distinctive grains. Atomic force microscopy results showed a surface roughness of 4.47 nm. Transmission spectra of the films were studied and the transparency was found to be above 80%. The optical band gap was found to be around 2.4 eV in accordance with the reported values. The results show that device quality buffer layers can be deposited using Hot-wall deposition. (C) 2018 Elsevier B.V. All rights reserved. |
| Databáze: | OpenAIRE |
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