Complete On-Wafer Noise-Figure Characterization of 60-GHz Differential Amplifiers
| Autor: | Ralf M T Pijper, Edwin van der Heijden, Luuk F Tiemeijer |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Engineering
Noise temperature Radiation Noise measurement Noise-figure meter business.industry Amplifier Electrical engineering Condensed Matter Physics Noise figure Low-noise amplifier Noise (electronics) Electronic engineering Effective input noise temperature Electrical and Electronic Engineering business |
| Zdroj: | IEEE Transactions on Microwave Theory and Techniques. 58:1599-1608 |
| ISSN: | 1557-9670 0018-9480 |
| DOI: | 10.1109/tmtt.2010.2049167 |
| Popis: | In this paper, we show that the differential noise figure of differential amplifiers is better measured directly by using baluns rather than be derived from single-ended measurements. For on-wafer measurements at 60 GHz, this can best be done using RF probes with integrated baluns. To extract the full 4 × 4 noise correlation matrix needed to predict the circuit behavior under any operating condition, this needs to be extended with at least one single-ended noise-figure measurement taken on an individual amplifier. For the experimental two-stage differential amplifier realized in 45-nm node CMOS studied in this paper, we found a noise figure of 3.2 dB. This is, to the best of our knowledge, the lowest noise figure reported at 60 GHz in any CMOS technology thus far. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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