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Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change dynamically or optimize the testing sequence. What is not covered is how also to reconfigure dynamically the system or unit under test and the test equipment from its present state to the state required for the desired test. This issue is especially acute in organizational level at-system testing where there can be a large number of possible states for the system under test and test hook ups when compared to Intermediate or Depot level Line Replaceable Unit (LRU) and/or board testing. At-system diagnostics refers to testing and diagnosis performed on electro-mechanical equipment right at the unit. Faults are typically isolated to the LRU level. At-system diagnostics can be embedded in the weapon system, hosted on a portable computer, or a combination of the two. The Army's primary piece of equipment used to facilitate this type of testing is a Maintenance Support Device (MSD), a ruggedized laptop computer. When combined with weapon system specific at-system diagnostics hardware (cables, test adapters, etc.) and software, the Test Program Set (TPS) enables comprehensive maintenance and diagnostic capabilities. This paper will describe work performed by the U.S. Army Automated Test Systems Division (ATSD) at the Armament Research Development & Engineering Center (ARDEC) at Picatinny Arsenal, NJ to design and implement a model based State Configuration Controller. How this solution can be used with any or even multiple reasoners, provided the proper interface is implemented, will also be discussed. |
