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This paper describes strategies and techniques used to diagnose failures in the IBM 600 MHz G5 (Generation 5) CMOS microprocessor and associated cache chips. Time-to-market pressure demands quick diagnostic turnaround time while the complexity, density, cycle time, and technology issues of the hardware increase the difficulty of diagnosis. Since G5 first silicon, intense diagnostics and physical failure analysis (PFA) have successfully identified the root cause of many failures, including examples of process, design, and random manufacturing defects. This success is attributed to the three techniques described in this paper. For each technique, an example is presented to demonstrate its effectiveness. |
