Robust functionalization of amorphous cadmium sulfide films using z-lift amplitude modulated atomic force microscopy-assisted electrostatic nanolithography

Autor: Robert Mallik, Ivan Dolog, Sergei F. Lyuksyutov
Rok vydání: 2007
Předmět:
Zdroj: Applied Physics Letters. 90:213111
ISSN: 1077-3118
0003-6951
DOI: 10.1063/1.2742910
Popis: A robust technique, based on vertical (z-lift) manipulation of a negatively biased oscillating atomic force microscope cantilever, is developed which creates raised columnar nanostructures with high aspect ratios (up to 40nm high/150nm wide) on amorphous CdS thin films. The nanostructures’ height (8–40nm) is proportional to z-lift of the tip and correlates with CdS film thickness. An in-house modified electric force microscopy is used to record the associated surface charge distribution which is found to be opposite to that of the tip.
Databáze: OpenAIRE