Robust functionalization of amorphous cadmium sulfide films using z-lift amplitude modulated atomic force microscopy-assisted electrostatic nanolithography
Autor: | Robert Mallik, Ivan Dolog, Sergei F. Lyuksyutov |
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Rok vydání: | 2007 |
Předmět: |
Kelvin probe force microscope
Materials science Physics and Astronomy (miscellaneous) business.industry Atomic force acoustic microscopy Nanotechnology Conductive atomic force microscopy Local oxidation nanolithography Amorphous solid Nanolithography Optoelectronics business Non-contact atomic force microscopy Photoconductive atomic force microscopy |
Zdroj: | Applied Physics Letters. 90:213111 |
ISSN: | 1077-3118 0003-6951 |
DOI: | 10.1063/1.2742910 |
Popis: | A robust technique, based on vertical (z-lift) manipulation of a negatively biased oscillating atomic force microscope cantilever, is developed which creates raised columnar nanostructures with high aspect ratios (up to 40nm high/150nm wide) on amorphous CdS thin films. The nanostructures’ height (8–40nm) is proportional to z-lift of the tip and correlates with CdS film thickness. An in-house modified electric force microscopy is used to record the associated surface charge distribution which is found to be opposite to that of the tip. |
Databáze: | OpenAIRE |
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