Raman Spectroscopy of Folded Tetralayer Graphenes Prepared by Atomic Force Microscope
| Autor: | Zhisheng Peng, Jia Liu, Weiguo Chu, Xiannian Chi, Jinzhong Cai, Junyi Yue, Lianfeng Sun, Xiao Hu, Julienne Impundu |
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| Rok vydání: | 2018 |
| Předmět: |
Range (particle radiation)
Yield (engineering) Materials science Graphene Bilayer Edge (geometry) Laser Molecular physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention symbols.namesake General Energy law symbols Physical and Theoretical Chemistry Raman spectroscopy Bilayer graphene |
| Zdroj: | The Journal of Physical Chemistry C. 122:28362-28367 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.8b09423 |
| Popis: | In this work, we report that when a modulated force is applied to the edge of a bilayer graphene with an atomic force microscope (AFM), two kinds of folded tetralayer graphenes can be obtained: one has one rupture and the other has two ruptures. The twist angle between two bilayer graphenes is found to be in the range of 1.8°∼27.7°. Systematic Raman studies show that the position, width, and intensity of 2D and G peaks of the folded tetralayer graphene depend sensitively on these angles. Meanwhile, the intensity enhancement of G mode of twisted tetralayer graphenes has been observed at twist angles of 11.5° and 13.2°. At these two twist angles, the 2D peak of twisted tetralayer graphenes can be fitted by three Lorentzian peaks at laser energy of 2.33 and 2.41 eV. Using an AFM probe to fabricate twisted graphene has the advantages of high yield, controllable positions, and no introduction of chemical pollutants, which has many potentials in future electronics. |
| Databáze: | OpenAIRE |
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