Prediction of Infected Devices Using the Quantification Theory Type 3 Based on MITRE ATT&CK Technique
| Autor: | Yosuke Katano, Yukihiro Kozai, Satoshi Okada, Takuho Mitsunaga |
|---|---|
| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE International Conference on Computing (ICOCO). |
| DOI: | 10.1109/icoco56118.2022.10031822 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|