Autor: |
J. Lange, H. Burzlaff |
Rok vydání: |
1995 |
Předmět: |
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Zdroj: |
Acta Crystallographica Section A Foundations of Crystallography. 51:931-936 |
ISSN: |
0108-7673 |
DOI: |
10.1107/s0108767395009974 |
Popis: |
The Laue technique is suitable to study effects that depend on wavelength such as absorption, anomalous dispersion or secondary extinction. The accuracy of the measured integrated intensities for X-ray structure determination is comparable with measurements of conventionally collected data. The present paper describes and discusses the results of a single-crystal data collection with a Laue diffractometer. The results obtained from the Laue data are in very good agreement with the results from conventionally collected data. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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