Real-Time Investigation of NanoFET Current Surge Capability During Heavy Ion Irradiation

Autor:	Thomas Baumann, Zhun Liu, R. M. Ronningen, Mary Anne Tupta, Benjamin W. Jacobs, Kan Xie, A.F. Zeller, Virginia M. Ayres, Steven Allen Hartz
Rok vydání:	2013
Předmět:	Materials science business.industry Nanowire Gallium nitride Thermionic emission Ion chemistry.chemical_compound chemistry Forensic engineering Optoelectronics Field-effect transistor Current (fluid) Surge business Quantum tunnelling
Zdroj:	MRS Proceedings. 1512
ISSN:	1946-4274 0272-9172
DOI:	10.1557/opl.2013.275
Popis:	The real-time electronic performance of a gallium nitride nanowire-based field effect transistor was investigated at five-minute intervals over thirty minutes of continuous irradiation by Xenon-124 relativistic heavy ions. An initial current surge that resulted in device improvement rather than device failure was observed. The current surge, and subsequent electronic behavior, was modeled using a combined thermionic emission-tunnelling approach, leading to information about barrier height, carrier concentrations, expected temperature behavior, and tunnelling.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d5cb16735c4e2a3364cb752458353195 https://doi.org/10.1557/opl.2013.275 Zobrazit plný text záznamu Full text from SpringerLink